* Corresponding authors
a College of Engineering, University of Georgia, Athens, GA 30602, USA
E-mail: xqwang@uga.edu, rmparti@uga.edu
b Department of Applied Mechanics, Beijing Institute of Technology, Beijing 100081, China
c Research Institute of Advanced Structure Technology, Beijing Institute of Technology, Beijing 100081, China
AbstractPhosphorene, also known as monolayer black phosphorus, has been enjoying popularity in electronic devices due to its superior electrical properties. However, it's relatively low Young's modulus, low fracture strength and susceptibility to structural failure have limited its application in mechanical devices. Therefore, in order to design more mechanically reliable devices that utilize phosphorene, it is necessary to explore the fracture patterns and energy release rate of phosphorene. In this study, molecular dynamics simulations are performed to investigate phosphorene's fracture mechanism. The results indicate that fracture under uniaxial tension along the armchair direction is attributed to a break in the interlayer bond angles, while failure in the zigzag direction is triggered by the break in both intra-layer angles and bonds. Furthermore, we developed a modified Griffith criterion to analyze the energy release rate of phosphorene and its dependence on the strain rates and orientations of cracks. Simulation results indicate that phosphorene's energy release rate remains almost unchanged in the armchair direction while it fluctuates intensively in the zigzag direction. Additionally, the strain rate was found to play a negligible role in the energy release rate. The geometrical factor α in the Griffith's criterion is almost constant when the crack orientation is smaller than 45 degree, regardless of the crack orientation and loading direction. Overall, these findings provide helpful insights into the mechanical properties and failure behavior of phosphorene.
You have access to this article
Please wait while we load your content... Something went wrong. Try again? Supplementary files Article informationNanoscale, 2016,8, 5728-5736
N. Liu, J. Hong, R. Pidaparti and X. Wang, Nanoscale, 2016, 8, 5728 DOI: 10.1039/C5NR08682E
To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.
If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.
If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.
Read more about how to correctly acknowledge RSC content.
Fetching data from CrossRef.
This may take some time to load.
RetroSearch is an open source project built by @garambo | Open a GitHub Issue
Search and Browse the WWW like it's 1997 | Search results from DuckDuckGo
HTML:
3.2
| Encoding:
UTF-8
| Version:
0.7.4