Fit Class Cover Catch Digraph Classification models that can be used in machine learning. Pure and proper and random walk approaches are available. Methods are explained in Priebe et al. (2001) <doi:10.1016/S0167-7152(01)00129-8>, Priebe et al. (2003) <doi:10.1007/s00357-003-0003-7>, and Manukyan and Ceyhan (2016) <doi:10.48550/arXiv.1904.04564>.
Version: 0.3.2 Depends: R (≥ 4.2) Imports: Rcpp, RANN, Rfast, proxy LinkingTo: Rcpp, RcppArmadillo Published: 2023-04-24 DOI: 10.32614/CRAN.package.rcccd Author: Fatih Saglam [aut, cre] Maintainer: Fatih Saglam <saglamf89 at gmail.com> License: MIT + file LICENSE NeedsCompilation: yes Materials: README CRAN checks: rcccd results Documentation: Reference manual: rcccd.pdf Downloads: Package source: rcccd_0.3.2.tar.gz Windows binaries: r-devel: rcccd_0.3.2.zip, r-release: rcccd_0.3.2.zip, r-oldrel: rcccd_0.3.2.zip macOS binaries: r-release (arm64): rcccd_0.3.2.tgz, r-oldrel (arm64): rcccd_0.3.2.tgz, r-release (x86_64): rcccd_0.3.2.tgz, r-oldrel (x86_64): rcccd_0.3.2.tgz Reverse dependencies: Reverse depends: imbalanceDatRel Linking:Please use the canonical form https://CRAN.R-project.org/package=rcccd to link to this page.
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